The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Apr. 29, 2014
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Rajeev Naduthota, Karnataka, IN;

Rajni Jain, Karnataka, IN;

Ranganathan Srinivasan, Karnataka, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G06N 5/04 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/048 (2013.01); G05B 23/0272 (2013.01);
Abstract

A method includes, using at least one processing device, obtaining multiple diagnostic indicators associated with at least a portion of an industrial process system and combining the diagnostic indicators to form a generalized indicator. Each diagnostic indicator has a value, and the generalized indicator is associated with a position on a continuous scale. The continuous scale could include a color gradient, and the method could include displaying the generalized indicator along the color gradient with a color based on its position. Multiple generalized indicators associated with multiple portions of the process system could be displayed within a torus or circle, and different portions of the torus or circle can be associated with different portions of the process system. Different concentric tori or circles could be associated with different periods of time, and at least one concentric torus or circle could identify a predicted behavior of the process system.


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