The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
May. 24, 2012
Applicants:
Yuki Watanabe, Tokyo, JP;
Atsushi Hiroike, Tokyo, JP;
Inventors:
Yuki Watanabe, Tokyo, JP;
Atsushi Hiroike, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06F 17/30 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6228 (2013.01); G06F 17/30247 (2013.01); G06F 17/30259 (2013.01); G06K 9/6256 (2013.01); G06K 9/6807 (2013.01); G06K 2209/21 (2013.01); G06K 2209/27 (2013.01);
Abstract
The purpose of the present invention is to provide an image analysis technique enabling a detection subject to be rapidly detected from image data. This image analysis device generates metadata for a query image containing the detection subject, and using the metadata, narrows down the image data serving as the search subject beforehand and then conducts object detection.