The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Nov. 06, 2013
Applicant:
Costruzioni Strumenti Oftalmici C.s.o. S.r.l., Scandicci (Florence), IT;
Inventors:
Assignee:
COSTRUZIONI STRUMENTI OFTALMICI C.S.O. S.R.L., Scandicci (Florence), IT;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0061 (2013.01); A61B 3/103 (2013.01); A61B 3/1015 (2013.01); G06K 9/00604 (2013.01); G06K 9/4661 (2013.01); G06K 9/52 (2013.01);
Abstract
The present invention refers in general to the measurement of aberrations of the optical system (E) of a living being, in particular human. More specifically, the invention refers to methods and systems for reconstructing a wavefront (W(z,p)) and/or for constructing a refracting error map.
Giannozzi, Franco. (2017). Method and apparatus for measuring aberrations of an ocular optical system (U.S. Patent No. 9665771). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9665771
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