The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Sep. 09, 2014
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Barry Patrick Benight, San Jose, CA (US);

David Slik, Northridge, CA (US);

Anusha Kopparam, Bangalore, IN;

Assignee:

NetApp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 3/06 (2006.01); G06F 17/30 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 3/064 (2013.01); G06F 3/0683 (2013.01); G06F 3/0689 (2013.01); G06F 11/1092 (2013.01); G06F 17/30312 (2013.01); H04L 67/1097 (2013.01); G06F 2003/0692 (2013.01);
Abstract

Technology is disclosed for a data storage architecture for providing enhanced storage resiliency for a data object. The data storage architecture can be implemented in a single-tier configuration and/or a multi-tier configuration. In the single-tier configuration, a data object is encoded, e.g., based on an erasure coding method, to generate many data fragments, which are stored across many storage devices. In the multi-tier configuration, a data object is encoded, e.g., based on an erasure coding method, to generate many data segments, which are sent to one or more tiers of storage nodes. Each of the storage nodes further encodes the data segment to generate many data fragments representing the data segment, which are stored across many storage devices associated with the storage node. The I/O operations for rebuilding the data in case of device failures is spread across many storage devices, which minimizes the wear of a given storage device.


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