The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

May. 29, 2009
Applicants:

Zsolt Kalmar, Shrewsbury, MA (US);

Gregoire Hamon, Boston, MA (US);

William J Aldrich, Natick, MA (US);

Inventors:

Zsolt Kalmar, Shrewsbury, MA (US);

Gregoire Hamon, Boston, MA (US);

William J Aldrich, Natick, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); H04L 1/24 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 8/34 (2013.01); G06F 8/10 (2013.01); G06F 11/3684 (2013.01); H04L 1/244 (2013.01);
Abstract

A computer-implemented method includes obtaining a first representation of a system, obtaining a set of test obligations, and automatically generating one or more test cases from the first representation based on the set of test obligations. The method further includes obtaining a second representation that is related to the first representation, obtaining an analysis criterion for the second representation, and assessing the analysis criterion using the one or more test cases applied to the second representation. Based on the assessing, one or more additional test obligations may be identified and a second set of one or more test cases may be generated based on the one or more additional test obligations.


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