The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Dec. 26, 2013
Emc Corporation, Hopkinton, MA (US);
Dan Aharoni, Brookline, MA (US);
Hui Wang, Upton, MA (US);
Gil Ratsaby, Mevaseret Zion, IL;
Hagay Dagan, Pardes Hanna-Karkur, IL;
Amnon Naamad, Brookline, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Determining cumulative workload skew is described. Measurements for one or more logical devices are determined. The set of measurements include, for each of N storage tiers, a workload measurement identifying workload directed to the single tier, and a capacity measurement identifying an amount of data stored in the single tier. N points may be determined using the measurements. Each point corresponds to a different storage tier and has a first coordinate identifying a cumulative percentage of data portions stored in the storage tier and all other tiers having a higher performance ranking than the one storage tier, and a second coordinate denoting an aggregated percentage of total workload directed to the foregoing cumulative percentage of data portions. A curve representing a cumulative workload skew may be determined using these N points and a point of origin.