The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Apr. 28, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Khosro Mohammad Rabii, San Diego, CA (US);

Suhail Jalil, Poway, CA (US);

Mohamed Imtiaz Ahmed, San Marcos, CA (US);

Dat Tien Pham, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G06F 3/0412 (2013.01); G06F 3/0416 (2013.01); G06F 3/0418 (2013.01);
Abstract

Certain aspects relate to systems and techniques for scan control for scanning a touch panel. The scan control system can alternate adaptively between scanning the touch panel in a passive scan mode requiring minimal power and in a focused active scan mode that sequentially scans only a portion of the touch panel. The scan control system can monitor the absolute capacitance of some or all of the sensors of the touch panel in passive scan mode and can monitor the mutual capacitance of a portion of the touch panel in focused active scan mode. If the absolute capacitance of any sensor is greater than the baseline capacitance, then the scan control can use this absolute capacitance touch data to determine one or more sub-regions of the touch panel for scanning in focused active scan mode. The mutual capacitance touch data can be used for determining features of the touch event.


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