The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Jul. 18, 2013
Applicant:
Siemens Aktiengesellschaft, Munich, DE;
Inventors:
Thilo Hannemann, Erlangen, DE;
Mario Reinwand, Breitbrunn, DE;
Assignee:
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01T 1/36 (2006.01); A61B 6/03 (2006.01); G01T 1/17 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
G01T 1/36 (2013.01); A61B 6/032 (2013.01); A61B 6/4014 (2013.01); A61B 6/4241 (2013.01); A61B 6/482 (2013.01); A61B 6/5258 (2013.01); G01T 1/17 (2013.01); A61B 6/0457 (2013.01); A61B 6/5205 (2013.01);
Abstract
An embodiment of the invention relates to the use of the spectral composition of X-ray radiation in addition to the intensity thereof in order to determine the attenuation caused by an object. Another aspect of an embodiment of the invention is a device, particularly a radiation monitor for an X-ray or CT system, which is suitable for performing the aforementioned procedure according to an embodiment of the invention.
Hannemann, Thilo. (2017). Method and device for determining the x-ray radiation attenuation caused by the object to be examined (U.S. Patent No. 9664801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9664801
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile