The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Jun. 23, 2015
International Business Machines Corporation, Armonk, NY (US);
Fei Dong, Shanghai, CN;
Shu Gong, Shanghai, CN;
Hai Long Li, Beijing, CN;
Yin Peng Lv, Shanghai, CN;
Liu Di Wang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are a test apparatus and a test method for testing a plurality of blocks in a circuit, the plurality of blocks having identical structures. The test apparatus comprises: a comparing device, configured to collect output responses generated by the plurality of blocks by applying an excitation signal to the plurality of blocks in parallel, compare the output responses of the plurality of blocks to determine whether the output responses of the plurality of blocks are identical, and output results of the comparison of the comparing device; and a determining device, configured to receive the results of the comparison of the comparing device, and determine whether the plurality of blocks have a defect according to the results of the comparison of the comparing device. With the test apparatus and the test method, a process for testing the plurality of blocks having the identical structures may be simplified, and test efficiency may be improved.