The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Jul. 29, 2015
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Kok-Tiong Tee, Hsin-Chu, TW;

Heng-Meng Liu, Jhubei, TW;

Yipin Wu, Singapore, SG;

Assignee:

MEDIATEK INC., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31725 (2013.01); G01R 31/3016 (2013.01);
Abstract

A method for providing an on-chip variation determination and an integrated circuit utilizing the same are provided. The method includes: outputting, by a launch register circuit, a test data to the capture register circuit according to the first clock; receiving, by a capture register circuit, the test data from the launch register circuit according to the second clock; adjusting, by a control circuit, a first number of a first chain of delay elements to generate the first clock and a second number of a second chain of delay elements for the capture register circuit to just capture the test data to generate the second clock; and determining, by the control circuit, a path delay between the launch register circuit and the capture register circuit based on the first number of the first chain of delay elements and the second number of the second chain of delay elements.


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