The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Jan. 09, 2014
Applicant:

Milwaukee Electric Tool Corporation, Brookfield, WI (US);

Inventors:

Justin D. Dorman, Wauwatosa, WI (US);

Jason R. Crowe, Seattle, WA (US);

Evans H. Nguyen, Renton, WA (US);

Dwight Hyland, Brookfield, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06788 (2013.01); G01R 1/04 (2013.01);
Abstract

A test and measurement device including a housing, a circuit disposed within the housing, and a display located on the housing. The device includes a first probe and a second probe. Each of the first probe and the second probe includes a probe body, a conductive tip, and a probe wire. Each of the first probe and the second probe is coupled to the housing and in electrical communication with the circuit. The device also includes a first groove that has a first projection and a second projection. The first groove is configured to receive one of the probe bodies, and the projections are configured to retain the one of the probe bodies within the first groove. A second groove is configured to receive the other of the probe bodies.


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