The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Dec. 16, 2013
Embraer S.a., Sao Jose dos Campos—SP, BR;
Universidade Federal DE Uberlândia, Uberlândia—MG, BR;
Carlos Alberto Gallo, Uberlândia, BR;
Domingos Alves Rade, Uberlândia, BR;
Elias Bitencourt Teodoro, Uberlândia, BR;
Luiz Gustavo Martins, Uberlândia, BR;
Marcos Morais de Souza, Uberlândia, BR;
Roberto Mendes Finzi Neto, Uberlândia, BR;
Valder Steffen, Jr., Uberlândia, BR;
Camila Gianini Gonsalez, Sao Jose dos Campos, BR;
Glauco Humberto Gomes, Sao Jose dos Campos, BR;
Fernando Dotta, Sao Jose dos Campos, BR;
Mauricio Hartmann, Sao Jose dos Campos, BR;
Paulo Anchieta da Silva, Sao Jose dos Campos, BR;
Ricardo Pinheiro Rulli, Sao Jose dos Campos, BR;
Embraer S.A., São José dos Campos, BR;
Universidade Federal de Uberlândia, Uberlândia, BR;
Abstract
A method to acquire the structural health state of an aircraft mechanical component performs measurements at each frequency point of interest by using a network of transducers and working each one simultaneously as actuator and sensor. Each transducer is individually excited by a sinusoidal, constant frequency and arbitrary amplitude, voltage waveform for each arbitrary frequency point used to interrogate the structure. A dedicated hardware executes an analogical (analog) quantization to measure electrical current and average electrical power consumed by each transducer. With these two variables, the electromechanical signature of the structure is obtained at different areas of the monitored structure.