The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

May. 13, 2015
Applicant:

Bonraybio Co., Ltd., Taichung, TW;

Inventors:

Hui-Ching Lu, Taichung, TW;

Cheng-Teng Hsu, Taichung, TW;

Assignee:

BONRAYBIO CO., LTD., Taichung, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 33/487 (2006.01); G01N 21/80 (2006.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); G01N 33/48778 (2013.01); G01N 21/80 (2013.01); G01N 2021/0389 (2013.01);
Abstract

A testing equipment with a magnifying function includes a carrier, a cover and a magnifying part. The carrier has a specimen holding area formed on the top of the carrier. The cover is stacked on the specimen holding area of the carrier. The magnifying part disposed on the cover. The location of the magnifying part is corresponding to the location of the specimen holding area. The testing equipment of the present application has a simplified and cheap structure for a simple specimen testing.


Find Patent Forward Citations

Lu, Hui-Ching. (2017). Testing equipment with magnifying function (U.S. Patent No. 9664611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9664611

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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