The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Aug. 03, 2011
Applicant:

Tetsuma Yamakaji, Saitama, JP;

Inventor:

Tetsuma Yamakaji, Saitama, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); G01M 11/02 (2006.01); G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0257 (2013.01); G02C 7/027 (2013.01); G02C 7/061 (2013.01); G02C 2202/06 (2013.01);
Abstract

With respect to the evaluation of custom-made eyeglass lenses using a binocular visual acuity function, a measurement value including essentially at least one of or both of a positive relative convergence or a negative relative convergence of the positive relative convergence, the negative relative convergence, a positive relative accommodation, a negative relative accommodation and a vertical fusional vergence is provided as a factor.


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Yamakaji, Tetsuma. (2017). Eyeglass lens evaluation method, eyeglass lens design method, eyeglass lens manufacturing method, eyeglass lens manufacturing system, and eyeglass lens (U.S. Patent No. 9664591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9664591

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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