The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Jun. 16, 2014
Honeywell International Inc., Morristown, NJ (US);
Kwong W. Au, Bloomington, MN (US);
Sharath Venkatesha, Minnetonka, MN (US);
Stefano Bietto, Tulsa, OK (US);
HONEYWELL INTERNATIONAL INC., Morris Plains, NJ (US);
Abstract
A process is provided for mapping temperatures in an enclosure. A spectral band for a multi-spectral image-capturing device is selected. An intensity-temperature mapping is generated by performing an intensity-temperature calibration based on an intensity of an image pixel in a field of view (FOV) generated by the multi-spectral image-capturing device, a corresponding temperature measurement, and a selected device setting of the image-capturing device. An emitted radiation is detected based on a first spectral image in the FOV. At least one region is determined whether it is poor responsive, which is underexposed or overexposed, such that an accurate temperature is unable to be estimated based on a temperature value associated with the spectral band. Temperatures of the at least one poor responsive regions are replaced with temperatures from corresponding acceptable regions from at least one other spectral image to provide an extended temperature mapping of the enclosure.