The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Jun. 03, 2015
Dr. Johannes Heidenhain Gmbh, Traunreut, DE;
DR. JOHANNES HEIDENHAIN GMBH, Traunreut, DE;
Abstract
An interferential position-measuring device determines a position of an object which is disposed to be movable along a measurement direction. A light source is configured to emit a beam which is split into two sub-beams. One of the sub-beams impinges on an optical functional element on the object. The sub-beams are subsequently superimposed and interfered at a superposition location and a resulting signal beam propagates toward an evaluation unit configured to generate a position-dependent measurement signal from the resulting signal beam. A switching element is disposed in the signal path downstream of the superposition location and upstream of a signal-digitizing device. The switching element is configured to define a specific sampling point in time.