The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2017

Filed:

Apr. 16, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Itaru Chida, Kanagawa-ken, JP;

Katsunori Shiihara, Kanagawa-ken, JP;

Yasuaki Tokunaga, Kanagawa-ken, JP;

Takeshi Maehara, Kanagawa-ken, JP;

Keiichi Hirota, Kanagawa-ken, JP;

Hiroya Ichikawa, Kanagawa-ken, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/03 (2006.01); B23K 26/70 (2014.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 26/707 (2015.10);
Abstract

A laser irradiation device in which laser light is adjusted to create a laser beam, including a protective glass window arranged in an emission region that emits the laser beam; a reflection mechanism that passes the laser beam and reflects visible light; a wavelength-dependent optical screening mechanism that cuts off light of a wavelength region other than visible light from the light that is reflected by the reflection mechanism; image pickup camera configured to capture the visible light reflected with the reflection optical element; and an image adjustment lens unit that adjusts an image in the visible light that is input from the wavelength-dependent optical screening mechanism. The wavelength-dependent optical screening mechanism is provided between the reflection optical element and the image camera.


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