The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9662081 B1

PDF
Full Text
Expired
Date of Patent:
May. 30, 2017

Filed:

May. 15, 2014
Applicant:

National University Corporation Kyoto University, Kyoto, JP;

Inventors:

Shinichi Maeda, Kyoto, JP;

Daigo Yoshikawa, Kyoto, JP;

Takumi Tanaka, Kyoto, JP;

Shin Ishii, Kyoto, JP;

Assignee:

Kyoto University, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/032 (2013.01); A61B 6/5258 (2013.01); G06T 11/005 (2013.01); G06T 11/006 (2013.01); G06T 11/008 (2013.01); A61B 6/4241 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/416 (2013.01);
Abstract

This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.


Find Patent Forward Citations

Maeda, Shinichi. (2017). X-ray ct image processing method, x-ray ct image processing program, and x-ray ct image device (U.S. Patent No. 9662081). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9662081

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