The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Sep. 25, 2014
Koninklijke Philips N. V., Eindhoven, NL;
Henning Per Johan Berglund, Sundbyberg, SE;
Jon Erik Fredenberg, Vallentuna, SE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A method for generating an energy-resolved X-ray image is proposed, usable e.g. for mammography or CT applications. First, a preferably low-dose X-ray beam () is directed through a region of interest of an object () such as a female breast and initial X-ray intensity values are acquired. Based on these initial X-ray intensity values, energy threshold values of for example a photon-counting energy-resolving X-ray detector () are specifically adapted to local properties and features of the object (). With such adapted energy threshold values, energy-resolved main X-ray intensity values are acquired for finally generating the energy-resolved X-ray image. The principle of such specific adapting of energy threshold values in energy-resolved X-ray image acquisition may be advantageously implemented in scanning X-ray systems wherein first detector elements () of a scanned X-ray detector () are used to acquire the initial X-ray intensity values in order to then set the energy threshold values for subsequent detector elements () with which main X-ray intensity values are acquired.