The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Sep. 22, 2014
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Yorito Sakano, Kanagawa, JP;

Takashi Abe, Kanagawa, JP;

Keiji Mabuchi, Kanagawa, JP;

Ryoji Suzuki, Kanagawa, JP;

Hiroyuki Mori, Kanagawa, JP;

Yoshiharu Kudoh, Kanagawa, JP;

Fumihiko Koga, Kanagawa, JP;

Takeshi Yanagita, Tokyo, JP;

Kazunobu Ota, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2011.01); H01L 27/146 (2006.01); H04N 5/3745 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2176 (2013.01); H01L 27/14609 (2013.01); H01L 27/14612 (2013.01); H01L 27/14623 (2013.01); H01L 27/14636 (2013.01); H01L 27/14641 (2013.01); H01L 27/14643 (2013.01); H01L 27/14689 (2013.01); H04N 5/37457 (2013.01);
Abstract

A solid-state imaging device is provided, which includes a photodiode having a first conductivity type semiconductor area that is dividedly formed for each pixel; a first conductivity type transfer gate electrode formed on the semiconductor substrate via a gate insulating layer in an area neighboring the photodiode, and transmitting signal charges generated and accumulated in the photodiode; a signal reading unit reading a voltage which corresponds to the signal charge or the signal charge; and an inversion layer induction electrode formed on the semiconductor substrate via the gate insulating layer in an area covering a portion or the whole of the photodiode, and composed of a conductor or a semiconductor having a work function. An inversion layer is induced, which is formed by accumulating a second conductivity type carrier on a surface of the inversion layer induction electrode side of the semiconductor area through the inversion layer induction electrode.


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