The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Jul. 08, 2015
Applicant:

Sindoh Co., Ltd., Seoul, KR;

Inventors:

Nam Ik Cho, Seoul, KR;

Byoung Bag Lee, Seoul, KR;

Cheol Ho Ohk, Seoul, KR;

Assignee:

SINDOH CO., LTD., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); H04N 1/46 (2006.01); G06K 9/40 (2006.01); H04N 1/409 (2006.01);
U.S. Cl.
CPC ...
H04N 1/4097 (2013.01); H04N 2201/0458 (2013.01);
Abstract

The present disclosure relates an image correction apparatus and method. The image correction apparatus includes a printing unit for printing an image; a scratch detecting unit which detects a scratch region from a scan image scanned per line; and a restoration processing unit which performs the restoration of the scratch region by interpolation if the width of the scratch region detected by the scratch detecting unit is less than a predetermined value and, if the width thereof is not less than the predetermined value, does not perform a restoration of the scratch region but provides the printing unit with the scan image, thereby correcting an image distortion by easily detecting an image distortion due to foreign matter.


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