The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Feb. 03, 2016
Spirent Communications, Inc., Sunnyvale, CA (US);
John Douglas Reed, Arlington, TX (US);
Spirent Communications, Inc., Sunnyvale, CA (US);
Abstract
The technology disclosed relates to systems and methods for testing adaptive antennas via a multi-probe anechoic chamber, which includes the emulation of real world conditions of a radio frequency (RF) signal reaching a device-under-test (DUT). The technology disclosed can be applied to test and evaluate a range of changed conditions. In one case, beamforming scenarios use separate spatial desired and interference signals, and the results can be compared to uniform interference. Based on performance for a segment of a test profile, the segment can be modified or expanded: shortened, repeated, or repeated with a modification—to fully evaluate the aspect being tested. Also, a dynamic profile that is utilized to evaluate a first device can be saved and repeated as a fixed profile for further testing of a first or second device.