The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Aug. 31, 2015
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Niles Nian Yang, Mountain View, CA (US);

Chris Avila, Saratoga, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01);
Abstract

A non-volatile flash memory has bit lines spanning multiple blocks grouped into columns, where each block is connected along multiple regular columns and one or more redundancy columns. When there is a local column defect, so that the defect is not at the level of the whole block or global column, the portions of a column at an individual block can be remapped to a portion of the same block along a redundant column. Sections of multiple columns from different blocks can be remapped to the same redundancy column. Then a memory block includes a number of independently accessible sub-blocks, the process can also be implemented at the sub-block level. A dynamic, system level implementation is presented.


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