The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Aug. 20, 2015
Xerox Corporation, Norwalk, CT (US);
Sudhagar Subbaian, Coimbatore, IN;
Sainarayanan Gopalakrishnan, Chennai, IN;
Xing Li, Webster, NY (US);
Vignesh Doss, Theni, IN;
Clara Cuciurean-Zapan, Fairport, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
The disclosed embodiments illustrate methods and systems for estimating a skew angle of an image. The method includes identifying a set of measurable blocks from one or more blocks in said image. The method further includes dilating each measurable block, in said set of measurable blocks, with a predetermined regular structure to create a set of modified measurable blocks. The method further includes selecting a second set of measurable blocks from said set of modified measurable blocks based on a size of each modified measurable block in said set of modified measurable blocks. Thereafter, the method includes determining a slope of each measurable block in said second set of measurable blocks. Further, the slope is utilizable to estimate said skew angle of said image. The method is performed by one or more microprocessors.