The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Jul. 31, 2012
Applicants:

Oren Gurfinkel, Rishon le zion, IL;

Oleg Verhovsky, Givataim, IL;

Eliraz Busi, Rehovot, IL;

Maya Yohay Rafalovich, Kfar Yona, IL;

Malcolm Isaacs, Modi'in, IL;

Inventors:

Oren Gurfinkel, Rishon le zion, IL;

Oleg Verhovsky, Givataim, IL;

Eliraz Busi, Rehovot, IL;

Maya Yohay Rafalovich, Kfar Yona, IL;

Malcolm Isaacs, Modi'in, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 8/36 (2013.01); G06F 8/70 (2013.01); G06F 8/71 (2013.01);
Abstract

A test-centric model of an application is constructed. Each resource specified by each test governing an application is added to the test-centric model. The test or tests specifying an resource are linked to the resource within the test-centric model. A composition of the application is defined using the one or more tests, as the resources specified by the one or more tests, within the test-centric model of the application.


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