The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Jan. 28, 2013
Applicant:

Rackspace Us, Inc., San Antonio, TX (US);

Inventors:

Paul Voccio, Windcrest, TX (US);

Matthew Charles Dietz, San Antonio, TX (US);

Assignee:

Rackspace US, Inc., San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01); G06F 11/3644 (2013.01);
Abstract

A system and methods are provided for function-specific tracing of a program. In one embodiment, a method includes generating a trace profile identifying one or more functions of a target program, wherein the trace profile identifies one or more functions to trace and depth of tracing for each function to be traced, loading the trace profile and the target program, identifying traced functions in the target program based on the trace profile, patching the target program to call a trace parameter for one or more functions, wherein traced functions are declared at runtime, and observing function calls for traced functions of the application. In this regard, individual functions are traced and debugged on a function-by-function basis without modifying the code or pre-arranging functions so they are traceable. As such, the scope of tracing may be dynamically limited to yield only information that is desired.


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