The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Nov. 03, 2014
Netapp, Inc., Sunnyvale, CA (US);
Kevin Faulkner, Westford, MA (US);
Leon Fairbanks, Winchester, MA (US);
Phil Larson, Chapel Hill, NC (US);
Siu Wu, Canton, MA (US);
Vinod Vasant Pai, Woburn, MA (US);
Abdul Basit, Morrisville, NC (US);
Curtis Hrischuk, Holly Springs, NC (US);
NETAPP, INC., Sunnyvale, CA (US);
Abstract
Methods and systems for inter-cluster storage system monitoring and analysis are provided. The method includes monitoring a non-volatile memory delay center for a first storage cluster having a first node and a second node configured to operate as a first high availability pair, where data for a write request to write data to the first node is also written to the second node as well as to a second cluster having a third node and a fourth node, where the third node and the fourth node are also configured to operate as a second high availability pair to store the data for the write request at one or both of the third and fourth node. The non-volatile memory delay center is used to monitor and detect latency due to any delay caused by a non-volatile memory of the first node used as a write cache.