The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Mar. 13, 2014
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventors:

Michael J. Broxton, San Francisco, CA (US);

Marc S. Levoy, Stanford, CA (US);

Noy Cohen, Stanford, CA (US);

Logan Grosenick, San Francisco, CA (US);

Samuel Yang, Stanford, CA (US);

Karl A. Deisseroth, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 27/00 (2006.01); H04N 13/02 (2006.01); H04N 5/225 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 27/0075 (2013.01); H04N 5/225 (2013.01); H04N 13/0232 (2013.01); G02B 3/0006 (2013.01);
Abstract

Images are detected in a manner that addresses various challenges as discussed herein. As may be consistent with one or more embodiments, aspects are directed to an apparatus having sets of photosensors that detect light rays received at different angles from a specimen via a microlens array, with the light rays detected by each set of photosensors representing an aliased view of the specimen. An output indicative of aliased views of the specimen is provided. Certain embodiments further include a logic circuit that processes the output and generates a deconvolved volume image by combining aliased views of the specimen as detected by the photosensors.


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