The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Mar. 31, 2012
Stefan Geissbuehler, Bern, CH;
Claudio Dellagiacoma, Renens, CH;
Matthias Geissbuehler, Lausanne, CH;
Theo Lasser, Denges, CH;
Marcel Leutenegger, Chavannes, CN;
Stefan Geissbuehler, Bern, CH;
Claudio Dellagiacoma, Renens, CH;
Matthias Geissbuehler, Lausanne, CH;
Theo Lasser, Denges, CH;
Marcel Leutenegger, Chavannes, CN;
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL), Lausanne, CH;
Abstract
The invention describes a method and a microscopy system for imaging and analyzing stochastically and independently blinking point-like emitters. A multiple-order cumulants analysis in conjunction with an established blinking model enables the extraction of super-resolved environment-related parameter maps, such as molecular state lifetimes, concentration and brightness distributions of the emitter. In addition, such parameter maps can be used to compensate for the non-linear brightness and blinking response of higher-order cumulant images—used for example in Super-resolution Optical Fluctuation Imaging (SOFI)—to generate a balanced image contrast. Structures that otherwise would be masked by brighter regions in the conventional cumulant image become samples using spectral cross-cumulants.