The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Oct. 26, 2015
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Eric Graetz, Krumpendorf, AT;

Hermann Bilban, Villach-Landskron, AT;

Rudolf Pairleitner, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/265 (2006.01); G01R 31/26 (2014.01); H01L 21/768 (2006.01); H01L 21/66 (2006.01); H01L 23/522 (2006.01); H01L 23/528 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2656 (2013.01); G01R 31/2607 (2013.01); H01L 21/768 (2013.01); H01L 22/32 (2013.01); H01L 22/34 (2013.01); H01L 23/528 (2013.01); H01L 23/5223 (2013.01); H01L 23/5227 (2013.01); H01L 29/0688 (2013.01); H01L 29/1608 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A power semiconductor device includes a semiconductor body. The semiconductor body includes an active semiconductor region and a perimeter semiconductor region surrounding the active semiconductor region. The active semiconductor region has an active surface area, and the perimeter semiconductor region has a perimeter surface area. The power semiconductor device further includes a test structure for contactless testing of the perimeter semiconductor region. The test structure includes an electrically conductive path mounted on the perimeter surface area. The test structure is configured to extract energy from a remotely generated electromagnetic radio frequency test field.


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