The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Mar. 17, 2015
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Takemi Yonezawa, Minowa, JP;

Tetsuhiro Yamada, Chino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 15/18 (2013.01); G01P 15/08 (2006.01); G01P 15/03 (2006.01);
U.S. Cl.
CPC ...
G01P 15/18 (2013.01); G01P 15/036 (2013.01); G01P 15/0891 (2013.01);
Abstract

An impact detection circuit includes a first detection section adapted to detect presence or absence of an impact input based on a first output signal as an output signal in a first detection axis of an inertial sensor having the first detection axis and a second detection axis different from each other, a second detection section adapted to detect presence or absence of an impact input based on a second output signal as an output signal in the second detection axis, and an impact detection determination section adapted to determine that an impact input has been made in a case in which both of the first detection section and the second detection section have detected the presence of the impact input.


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