The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Jul. 19, 2013
Nihon Kohden Corporation, Tokyo, JP;
Takahiro Shioyama, Tokyo, JP;
Akane Suzuki, Tokyo, JP;
Hirotsugu Kubo, Tokyo, JP;
Sunao Takeda, Tokyo, JP;
NIHON KOHDEN CORPORATION, Tokyo, JP;
Abstract
A method of analyzing cells, the method comprising: measuring a number of cells which are nuclear stained, in a to-be-determined tissue, and acquiring a histogram showing a fluorescence intensity based on a result of the measurement; analyzing the histogram, and acquiring data of predetermined parameters; comparing the data of the parameters with first thresholds predetermined for the parameters, to perform a first cancer determination for each of the parameters on the to-be-determined tissue; performing a scoring process for each of the parameters, on a result of the first cancer determination for each of the parameters, to calculate scores of the parameters; and combining the scores of the parameters with one another, thereby performing a second cancer determination on the to-be-determined tissue.