The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Feb. 03, 2014
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventor:
Yasunori Kawate, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe-shi, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 31/22 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 31/22 (2013.01); G01N 15/1012 (2013.01); G01N 2015/1018 (2013.01); Y10T 436/10 (2015.01); Y10T 436/101666 (2015.01); Y10T 436/102499 (2015.01); Y10T 436/106664 (2015.01);
Abstract
A standard material that is used for judging an abnormal portion in a particle analyzer is described. The standard material comprises first standard particles to be fluorescence-stained by a fluorescence-staining treatment and second standard particles that have preliminarily contained a fluorescence dye. A method and an analyzer that can judge an abnormal portion in a particle analyzer by using such a standard material are also described.