The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Jan. 16, 2013
Applicants:

Xuefei Guan, Princeton, NJ (US);

Jingdan Zhang, Plainsboro, NJ (US);

Shaohua Kevin Zhou, Plainsboro, NJ (US);

Mark W. Fischer, Pittsburgh, PA (US);

Waheed A. Abbasi, Murrysville, PA (US);

Scott A. Karstetter, Monroeville, PA (US);

Christopher John William Adams, Pittsburgh, PA (US);

Inventors:

Xuefei Guan, Princeton, NJ (US);

Jingdan Zhang, Plainsboro, NJ (US);

Shaohua Kevin Zhou, Plainsboro, NJ (US);

Mark W. Fischer, Pittsburgh, PA (US);

Waheed A. Abbasi, Murrysville, PA (US);

Scott A. Karstetter, Monroeville, PA (US);

Christopher John William Adams, Pittsburgh, PA (US);

Assignees:

Siemens Corporation, Iselin, NJ (US);

Siemens Energy, Inc., Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/90 (2006.01); G06F 17/11 (2006.01); G01R 31/34 (2006.01); G01N 27/20 (2006.01); G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/904 (2013.01); G01R 31/34 (2013.01); G06F 17/11 (2013.01); G01N 27/20 (2013.01); G01N 27/82 (2013.01); G01R 31/1227 (2013.01);
Abstract

In a general methodology for insulation defect identification in a generator core, a Chattock coil is used to measure magnetic potential difference between teeth. Physical knowledge and empirical knowledge is combined in a model to predict insulation damage location and severity. Measurements are taken at multiple excitation frequencies to solve for multiple characteristics of the defect.


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