The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Feb. 06, 2015
Applicants:
Martin M. Liphardt, Lincoln, NE (US);
Galen L. Pfeiffer, Roca, NE (US);
Inventors:
Martin M. Liphardt, Lincoln, NE (US);
Galen L. Pfeiffer, Roca, NE (US);
Assignee:
J.A. WOOLLAM CO., INC., Lincoln, NE (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); H04N 5/232 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/211 (2013.01); G01N 21/55 (2013.01); H04N 5/23212 (2013.01);
Abstract
In the context of an ellipsometer or the like, positioning a camera other than directly above a sample being investigated by an electromagnetic beam, while said camera provides an optical view of a surface of said sample which is in focus over the entire viewed extent of the sample, and wherein a contrast improving system involving two beams provided by a beam splitting system is utilized.
Liphardt, Martin. (2017). System for viewing samples that are undergoing ellipsometric investigation in real time (U.S. Patent No. 9658151). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9658151
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile