The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Apr. 26, 2012
Robert Freese, Pittsboro, NC (US);
Christopher Michael Jones, Houston, TX (US);
David Perkins, The Woodlands, TX (US);
Michael Simcock, Columbia, SC (US);
William Soltmann, The Woodlands, TX (US);
Robert Freese, Pittsboro, NC (US);
Christopher Michael Jones, Houston, TX (US);
David Perkins, The Woodlands, TX (US);
Michael Simcock, Columbia, SC (US);
William Soltmann, The Woodlands, TX (US);
HALLIBURTON ENERGY SERVICES, INC., Houston, TX (US);
Abstract
Optical computing devices containing one or more integrated computational elements may be used to produce two or more detector output signals that are computationally combinable to determine a characteristic of a sample. The devices may comprise a first integrated computational element and a second integrated computational element, each integrated computational element having an optical function associated therewith, and the optical function of the second integrated computational element being at least partially offset in wavelength space relative to that of the first integrated computational element; an optional electromagnetic radiation source; at least one detector configured to receive electromagnetic radiation that has optically interacted with each integrated computational element and produce a first signal and a second signal associated therewith; and a signal processing unit operable for computationally combining the first signal and the second signal to determine a characteristic of a sample.