The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Mar. 11, 2014
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

David S. Ochs, Torrance, CA (US);

Brian A. Welchko, Torrance, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 19/00 (2006.01);
U.S. Cl.
CPC ...
G01K 19/00 (2013.01); G01K 15/007 (2013.01); G01K 2205/00 (2013.01);
Abstract

A system and method for detecting an erratic state of a monitored sensor includes generating a variation value for a monitored signal generated by a monitored sensor and a variation value for an estimated signal estimated based on a predictive signal generated by predictive sensor, where the predictive signal is predictive of the monitored signal. The monitored signal can rapidly fluctuate based on system operating conditions. A dynamic threshold value is generated based on the estimated variation value, and the monitored signal is compared with the dynamic threshold value to determine if the monitored signal is in an erratic state. The detection method is sufficiently sensitive to distinguish between rapid fluctuation of the monitored sensor and an erratic state.


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