The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
May. 11, 2015
Applicant:
Flir Systems, Inc., Wilsonville, OR (US);
Inventors:
Eric A. Kurth, Santa Barbara, CA (US);
Patrick Franklin, Santa Barbara, CA (US);
Assignee:
FLIR Systems, Inc., Wilsonville, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/02 (2006.01); G01J 5/20 (2006.01); C25D 5/02 (2006.01); G01J 5/02 (2006.01); C25D 1/00 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/20 (2013.01); C25D 1/003 (2013.01); C25D 5/022 (2013.01); G01J 5/023 (2013.01); G01J 5/024 (2013.01); G01J 2005/0077 (2013.01);
Abstract
Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a plurality of metal studs each having a first end and a second end and each disposed between the first metal layer and a second metal layer, wherein the first end of each metal stud is disposed on a portion of the first metal layer that is at least partially on the surface of the substrate.