The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Feb. 04, 2013
Chemimage Corporation, Pittsburgh, PA (US);
Patrick J. Treado, Pittsburgh, PA (US);
Matthew Nelson, Harrison City, PA (US);
Charles W. Gardner, Gibsonia, PA (US);
ChemImage Corporation, Pittsburgh, PA (US);
Abstract
A system and method for analyzing unknown materials on surfaces including, but not limited to, chemical materials, biological materials, hazardous materials, drug materials, and non-threat materials using SWIR and/or extended range SWIR hyperspectral and spectroscopic techniques. A system comprising a collection optics, a tunable filter, and a first detector for generating a test data set representative of the unknown sample. A second detector, comprising a visible imaging device, may be configured to operate in a scanning mode to locate areas of interest for further interrogation using SWIR. A method comprising generating a SWIR test data set representative of the unknown sample and analyzing the unknown sample to detect, identify and/or distinguish an unknown material as a known material. This analysis may be achieved by comparing the test data set to a reference data set using at least one chemometric technique.