The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Oct. 18, 2013
Msc & Sgcc, Vourles, FR;
Marc Leconte, Loire sur Rhone, FR;
MSC & SGCC, Vourles, FR;
Abstract
A facility for measuring the thickness of the wall of containers includes an optical system for collecting and focusing on the detection plane of a light sensor and light beams reflected by the outer and inner surfaces of the wall. An optical collecting and focusing system includes a first objective having is object plane located in the vicinity of the impact of the incident light beam with the wall, an at least translucent diffusing screen located in the image plane of the first objective, so as to physically represent the light beams collected by the first objective as hot spots (Ti), and a second objective including, the diffusing screen as an object plane and the light sensor as an image plane.