The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Mar. 30, 2015
Applicant:
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Inventors:
Mariko Sato, Tokyo, JP;
Shojiro Furuya, Tokyo, JP;
Daichi Miyoshi, Tokyo, JP;
Yukito Hata, Tokyo, JP;
Assignee:
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F24B 15/08 (2006.01); F42B 15/08 (2006.01); F42B 15/01 (2006.01); F42B 35/00 (2006.01); H04N 17/00 (2006.01); F41G 7/00 (2006.01); G01S 3/78 (2006.01);
U.S. Cl.
CPC ...
F42B 15/08 (2013.01); F41G 7/004 (2013.01); F42B 15/01 (2013.01); F42B 35/00 (2013.01); G01S 3/7803 (2013.01); H04N 17/002 (2013.01);
Abstract
An optical test apparatus includes a three-dimensional dome, light sources and a control unit. The three-dimensional dome covers a field of view of an image acquisition device. The image acquisition device is a test target device. The light sources are dispersedly arranged on the three-dimensional dome and generate a predetermined image on the three-dimensional dome. The first control unit controls the light sources.