The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Oct. 23, 2015
General Electric Company, Schenectady, NY (US);
Yannan Jin, Niskayuna, NY (US);
Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);
Ge Wang, Loudonville, NY (US);
Yan Xi, Troy, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method includes receiving, with at least one processor, a first projection dataset corresponding to X-rays at a first energy level projected towards a subject at a first set of view angles and receiving, with the at least one processor, a second projection dataset corresponding to X-rays at a second energy level projected towards the subject at a second set of view angles. The method further includes identifying, with the at least one processor, a metal trace from at least one of the first projection dataset and the second projection dataset. Moreover, the method includes converting, with the at least one processor, at least a portion of the first projection dataset to a pseudo dataset at the second energy level. The method also includes generating, with the at least one processor, a final image of the subject based on the second projection dataset, the pseudo dataset, and the metal trace.