The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2017
Filed:
Apr. 06, 2012
David Huang, Portland, OR (US);
Yan LI, Portland, OR (US);
Ou Tan, Portland, OR (US);
Maolong Tang, Portland, OR (US);
David Huang, Portland, OR (US);
Yan Li, Portland, OR (US);
Ou Tan, Portland, OR (US);
Maolong Tang, Portland, OR (US);
UNIVERSITY OF SOUTHERN CALIFORNIA, Los Angeles, CA (US);
Abstract
This invention discloses methods and systems for measuring corneal epithelial thickness and power, stromal thickness, subepitheila corneal power and topography. The systems and methods disclosed herein are non-invasive, non-contact and automated imaging methods which preferably makes use of Fourier-domain optical tomography. Also disclosed herein are scanning patterns and image analysis methods for utilizing and analyzing Fourier-domain optical coherence tomography images to obtain information about conical epithelial and stromal properties as well as parameters useful for evaluating the properties. The methods and systems described herein are useful as eye disease diagnostic tools and eye surgery planning tools.