The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Apr. 29, 2016
Interdigital Patent Holdings, Inc., Wilmington, DE (US);
Benoit Pelletier, Roxboro, CA;
Paul Marinier, Brossard, CA;
Hongsan Sheng, San Diego, CA (US);
Kiran K. Vanganuru, San Diego, CA (US);
Diana Pani, Montreal, CA;
InterDigital Patent Holdings, Inc., Wilmington, DE (US);
Abstract
Channel quality may be measured in a device-to-device (D2D) communication network. The D2D communication network may include one or more D2D wireless transmit/receive units (WTRUs), wherein the D2D WTRUs may communicate using a D2D bandwidth. A D2D WTRU may receive a channel measurement resource configuration corresponding to a channel measurement resource. The D2D WTRU may further receive an RS on the channel measurement resource. The D2D WTRU may measure one or more channel state parameters from the channel measurement resource for a part of bandwidth overlapping with a D2D communication bandwidth, when the RS bandwidth is greater than the D2D communication bandwidth. The D2D WTRU may report the channel state parameters to a controlling entity. The controlling entity may configure a D2D frequency allocation between a transmitting device and a receiving device. The D2D frequency allocation may be based on the time averaged measurement.