The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Dec. 14, 2015
Nxp B.v., Eindhoven, NL;
NXP B.V., Eindhoven, NL;
Abstract
Transmitter (TX) modulation envelope parameters are defined in RF standards (e.g., ISO 14443, NFC Forum, EMVCo). These envelope parameters include rise/fall times, modulation index, etc. For standards compliancy, these envelope parameters must be within the respective limits. For example, shaping parameters are influenced by detuning the antenna with a counterpart device like a card or mobile phone, or by thermal influences on the matching network. This disclosure describes an NFC or RFID device that is able to detect and measure the detuning on the antenna and/or the matching network change. With this information, the NFC or RFID device can dynamically control the shaping parameters of the envelope, instead of relying on one single static configuration setting for the transmitter. In particular, changes in the Q (quality) factor are used for dynamically controlling the transmitter signal envelope shape for compensating the effect of antenna detuning and/or matching network variation.