The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

Jul. 29, 2016
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Kazunori Sakanobe, Tokyo, JP;

Koichi Arisawa, Tokyo, JP;

Futoshi Okawa, Tokyo, JP;

Masato Handa, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/08 (2006.01); H02H 3/00 (2006.01); H02H 7/08 (2006.01); F04B 35/04 (2006.01); F04B 51/00 (2006.01); F04C 28/28 (2006.01); F04C 29/00 (2006.01); G01K 7/36 (2006.01); G01K 15/00 (2006.01); H02H 7/122 (2006.01);
U.S. Cl.
CPC ...
H02H 3/08 (2013.01); F04B 35/04 (2013.01); F04B 51/00 (2013.01); F04C 28/28 (2013.01); F04C 29/0085 (2013.01); G01K 7/36 (2013.01); G01K 15/005 (2013.01); H02H 3/006 (2013.01); H02H 7/0833 (2013.01); H02H 7/122 (2013.01); F04B 2203/0201 (2013.01); F04C 2240/403 (2013.01);
Abstract

A current detection device for detecting an electric current flowing through an inverter, an overcurrent level generation device for generating an abnormality judgment reference value, an overcurrent detection device for generating an interruption signal to the inverter on the basis of an output of the current detection device and the abnormality judgment reference value, and an adjusting apparatus for correcting the abnormality judgment reference value of the overcurrent level generation device on the basis of the output at a time when a constant electric current is applied to the current detection device are provided. The overcurrent level generating device is provided with one or a plurality of resistance value adjusting sections, and generates the abnormality judgment reference value in correspondence to a resistance value of the resistance value adjusting section. The adjusting apparatus performs a zapping operation by means of applying a reverse-bias to a zener diode, and corrects the abnormality judgment reference value.


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