The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jun. 07, 2013
Applicant:
Waters Technologies Corporation, Milford, MA (US);
Inventors:
Henry Y. Shion, Andover, MA (US);
Giorgis Mezengie Isaac, Marlborough, MA (US);
Alan Millar, Southborough, MA (US);
Tim Riley, Ann Arbor, MI (US);
Assignee:
Waters Technologies Corporation, Milford, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/62 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); G01N 27/622 (2013.01); H01J 49/0045 (2013.01); H01J 49/164 (2013.01); H01J 49/165 (2013.01);
Abstract
The present disclosure relates, in part, to MS apparatus, methods, and/or software, having improved selectivity, sensitivity, specificity, resolution, mass accuracy and dynamic range over conventional MS technologies. In particular, the technology relates to apparatus, methods, and/or software wherein a combination of in-source fragmentation, ion mobility separation, and/or time-aligned parallel (TAP) sample ion fragmentations are utilized in mass spectrometry for the analysis of samples.