The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jun. 17, 2015
Llp “angstrem”, Karaganda, KZ;
Alexander Georgievich Turyanskiy, Moscow, RU;
Serik Kasimovich Kozhakhmetov, Almaty, KZ;
Alexander Nikolaevich Rodich, Moskovskaya oblast, RU;
Vadim Eval'dovich Skvortcov, Moskovskaya oblast, RU;
Roman Abramovich Khmelnitskiy, Moscow, RU;
LLP “ANGSTREM”, Karaganda, KZ;
Abstract
An X-ray source with optical indication of radiation, which can be used in various measuring devices for parameters control and visualization of structure of industrial and biological objects, is proposed. The source comprises a vacuum housing, an anode irradiated by electrons and generating the divergent flux of radiation, an exit window for X-ray radiation, means for optical indication of X-ray radiation beam including a source of optical radiation and an optical mirror. The anode is made composite in the form of a thin film and a radiolucent substrate luminescent in the optical range. The anode structure is an exit window of the source, and behind it the coaxially arranged means of collimation and focusing of X-ray and optical radiation and means of optical visualization of X-ray focus are mounted. The proposed device significantly increases the accuracy and informativity of optical indication of X-ray radiation parameters.