The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 2017
Filed:
Jan. 20, 2015
Applicant:
Mediatek Inc., Hsin-Chu, TW;
Inventors:
Chin-Jung Su, Hsinchu, TW;
Rei-Fu Huang, Hsinchu, TW;
Assignee:
MEDIATEK INC., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/56 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56012 (2013.01); G11C 29/12015 (2013.01);
Abstract
A memory-testing device for testing a memory is provided. The memory-testing device includes a testing circuitry and a register. The testing circuitry is coupled to the memory for testing performance of the memory. The register is coupled to the testing circuitry and inputted by a testing clock signal, wherein the testing clock signal is different from an original clock signal of the memory and/or the testing circuitry. The testing clock signal is utilized for adjusting the time when the memory-testing device latches data from the memory to decrease a timing slack of the memory-testing device.