The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2017

Filed:

May. 26, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Niles Yang, Milpitas, CA (US);

Bhuvan Khurana, Milpitas, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/00 (2013.01); G11C 7/10 (2013.01);
Abstract

A system and method of writing data to a memory block includes receiving user data in a memory controller to be written to the memory block. The user data is first written to a buffer. A screening pattern is written to at least one screening column and a first memory integrity test is performed based on at least one operational aspect of the memory block. The first memory integrity test includes reading screening column data from the at least one screening column and comparing the screening column data read from the at least one screening column to the screening pattern. The user data is written to at least one user data column in the memory block when the screening column data read from the at least one screening column matches the screening pattern in the first memory integrity test.


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